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Home > Publication > Paper
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No.
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¿¬±¸³í¹®
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41
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Ohmyoung Kwon, Geoff Wehmeyer & Chris Dames (2019) Modified Ballistic–Diffusive Equations for Obtaining Phonon Mean Free Path Spectrum from Ballistic Thermal Resistance: II. Derivation of Integral Equation Based on Ballistic Thermal Resistance, Nanoscale and Microscale Thermophysical Engineering, DOI: 10.1080/15567265.2019.1628135
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40
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Ohmyoung Kwon, Geoff Wehmeyer & Chris Dames (2019) Modified ballistic–diffusive equations for obtaining phonon mean free path spectrum from ballistic thermal resistance: I. Introduction and validation of the equations, Nanoscale and Microscale Thermophysical Engineering, 23:3, 259-273, DOI: 10.1080/15567265.2019.1619885
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39
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H. Chae, G. Hwang, O. Kwon "Fabrication of scanning thermal microscope probe with ultra-thin oxide tip and demonstration of its enhanced performance" Ultramicroscopy, Vol 171, 2016
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38
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G. Hwang, O. Kwon "Quantitative temperature profiling across nanoheater on silicon-on-insulator wafer using null-point scanning thermal microscopy" International Journal of Thermal Sciences, Vol 108, 2016
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37
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T. Kim, T. Seong, and O. Kwon "Investigating the origin of efficiency droop by profiling the voltage across the multi-quantum well of an operating light-emitting diode" Applied Physics Letters, vol 108, 231101 (2016)
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36
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K. Park, G. Hwang, H. Kim, J. Kim, W. Kim, S. Kim, and O. Kwon"Measurement of thermal conductivity of Bi2Te3 nanowire using high-vacuum scanning" Applied Physics Letters vol.108,071907 (2016)
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35
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G. Hwang and O. Kwon "Measuring the size dependence of thermal conductivity of suspended graphene disks using null-point scanning thermal microscopy" Nanoscale, 2016, 8, 5280
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34
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E. Jung, G. Hwang, J. Chung, O. Kwon, J. Han, Y. Moon, T. Seong, ¡°Investigating the Origin of Efficiency Droop by Profiling the Temperature across the Multi-Quantum Well of an Operating Light-Emitting Diode.¡± Applied Physics Letters, vol. 106, 041114, 2015
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33
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J. Chung, G. Hwang, H. Kim, H. Yang, O. Kwon, ¡°Towards an Accurate Measurement of Thermal Contact Resistance at CVD-grown Graphene/SiO2 interface Through Null Point Scanning Thermal Microscopy.¡± Journal of Nanoscience and Nanotechnology, vol 15,pp 9077-9082, 2015
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32
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G. Hwang, J. Chung, O. kwon, "Enabling low-noise null-point scanning thermal microscopy by the optimization of scanning thermal microscopy probe through a rigorous theory of quantitative measurement", Review of Scientific Instruments, vol. 85, 114901, 2014
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31
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K. Yoon, G. Hwang, J. Chung, H. Kim, O. Kwon, K.D. Kihm, J.S. Lee, "Measuring the thermalconductivity of residue-free suspended graphene bridge using null point scanning thermal microscopy", Carbon, vol. 76, pp77-83, 2014
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30
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B. Lee, K. Kim, S. Lee, J. H. Kim, D. S. Lim, O. Kwon, J. S. Lee, "Quantitative Thermopower Profiling across a Silicon p–n Junction with Nanometer Resolution", Nano Letters, vol. 12, pp. 4472, 2012
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29
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J. Chung, K. Kim, G. Hwang, O. Kwon, Y.K. Choi, J.S. Lee, "Quantitative temperature profiling through null-point scanning thermal microscopy", International Journal of Thermal Sciences, vol. 62, pp 109, 2012
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28
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K. Kim, J. Chung, G. Hwang, O. Kwon, J.S. Lee, "Quantitative measurement with scanning thermal microscopy by preventing the distortion due to the heat transfer through the air", ACS Nano, vol. 5, pp. 8700-8709, 2011
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27
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C.B. Kim, H. Chun, J. Chung, K.H. Lee, J.H. Lee, K.B. Song, S.H. Lee, In Situ Curing of Sliding SU-8 Droplet over a Microc ontact Printed Pattern for Tunable Fabrication of a Polydimethylsiloxane Nanoslit, Analytical Chemistry, vol 83, pp7221-7226, 2011
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26
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Kim, J.H.; Lee, S.K.; Hwang, K.S.; Kwon, O.M.; Lim, D.S., "Nano-Tribological Properties of Topographically Undulated Nanocrystalline Diamond Patterns", Journal of Nanoscience and Nanotechnology, vol.11, pp. 344, 2011.
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25
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J. Chung, K. Kim, G. Hwang, O. Kwon, S. Jung, J. Lee, J. W. Lee, G. T. Kim, "Quantitative temperature measurement of an electrically heated carbon nanotube using the null-point method", Review of Scientific Instruments, vol.81, pp.114901, 2010.
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24
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J. Chung, K. Kim, G. Hwang, O.M. Kwon, J.S. Lee, Y.K.Choi, ¡°Nanoscale range finding of subsurface structures by measuring the absolute phase lag of thermal wave,¡± Review of Scientific Instruments, vol.81, pp.053701, 2010
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23
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B.H. Lee, J.S. Lee, S.U. Kim, K.T. Kim, O.M. Kwon, S.K. Lee, J.H. Kim, D.S. Lim, ¡°Simultaneous measurement of thermal conductivity and interface thermal conductance of diamond thin film,¡± Journal of vacuum science and Technology B, vol.27, pp.2408, 2009.
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22
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J.H. Kim, S.K. Lee, O.M. Kwon, D.S. Lim, ¡°Ultra Thin CVD Diamond Film Deposition by Electrostatic Self-Assembly Seeding Process with Nano-Diamond Particles,¡± Journal of Nanoscience and Nanotechnology, Vol.9, pp. 7, 2009.
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21
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J.H. Kim, S.K. Lee, O.M. Kwon, S.I. Hong, D.S. Lim, ¡°Thickness controlled and smooth polycrystalline CVD diamond film deposition on SiO2 with electrostatic self assembly seeding process,¡± Diamond and Related Materials, Vol.18, pp.1218, 2009.
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20
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S.H. Choi, T.I. Lee, H.K. Baik, H.H. Roh, O.M. Kwon, D.H. Suh, ¡°The effect of electrode heat sink in organic-electronic devices,¡± Applied Physics Letters, Vol.93, pp.183301, 2008.
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19
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K.S. Oh, D.H. Kim, S.H. Park, J.S. Lee, O.M. Kwon, Y.K. Choi, ¡°Movement of hydrogen molecules in pristine, hydrogenated and nitrogen-doped single-walled carbon nanotubes,¡± Molecular Simulation, Vol.34, pp.1245-1252, 2008.
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18
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J.S. Jin, J.S. Lee, O.M. Kwon, ¡°Electron effective mean free path and thermal conductivity predictions of metallic thin films,¡± Applied Physics Letters, Vol.92, pp.171910, 2008.
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17
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S.G. Choi, T.J. Ha, B.G. Yu, S.P. Jaung, O.M. Kwon, H.H. Park, ¡°Improvement of uncooled infrared imaging detector by using mesoporous silica as a thermal isolation layer,¡± Ceramics International, Vol.34, pp.833-836, 2008.
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16
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D.W. Oh, O.M. Kwon, J.S. Lee, ¡°Transient Thermal Conductivity and Colloidal Stability Measurements of Nanofluids by Using the 3 omega Method,¡± Journal of nanoscience and nanotechnology, Vol.8, pp. 4923-4929, 2008.
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15
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K.T. Kim, J.H. Chung, J.B. Won, O.M. Kwon, J.S. Lee, S.H. Park, Y.K. Choi, ¡°Quantitative scanning thermal microscopy using double scan technique,¡± Applied Physics Letters, Vol.93, pp.203115, 2008.
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14
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K.T. Kim, J.S. Park, S.U. Kim, O.M. Kwon, J.S. Lee, S.H. Park, Y.K. Choi, ¡°Thermopower profiling of a silicon p-n junction¡±, Applied Physics Letters, vol. 90, pp. 43107, 2007.
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13
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H.H. Roh, J.S. Lee, D.L. Kim, J.S. Park, K.T. Kim, O.M. Kwon, S.H. Park, Y.K. Choi, A. Majumdar, "Novel nanoscale thermal property imaging technique: The 2 omega method. I. Principle and the 2w signal measurement," Journal of Vacuum Science and Technology B, Vol.24, pp. 2398-2404, 2006.
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12
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H.H. Roh, J.S. Lee, D.L. Kim, J.S. Park, K.T. Kim, O.M. Kwon, S.H. Park, Y.K. Choi, A. Majumdar, "Novel nanoscale thermal property imaging technique: The 2 omega method. II. Demonstration and comparison," Journal of Vacuum Science and Technology B, Vol.24, pp.2405-2411, 2006.
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11
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W.S. Chung, O.M. Kwon, J.S. Lee, Y.K. Choi, S.H. Park, ¡°Local flow speed measurement using tunable AC thermal anemometry,¡± Journal of Mechanical Science and Technology, Vol.19, pp. 1449-1459, 2005.
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10
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S.H. Park, J.S. Kim, J.H. Park, J.S. Lee, Y.K. Choi, O.M. Kwon, ¡°Molecular dynamics study on size-dependent elastic properties of silicon nanocantilevers,¡± Thin Solid Films, Vol.492, pp.285-289, 2005.
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9
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S.H. Park, H.J. Kim, K.H. Kang, J.S. Lee, Y.K. Choi, O.M. Kwon, ¡°Experimental and molecular dynamics study on crystallization of amorphous silicon under external fields,¡± Journal of Physics D-Applied Physics, Vol.38, pp. 1511-1517, 2005.
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8
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S. Park, S.S. Cho, J.S. Lee, Y.K. Choi, O.M. Kwon, ¡°Molecular Dynamics Study on External Field Induced Crystallization of Amorphous Argon Structure,¡± KSME International Journal, Vol.18, pp.2042-2048, 2004.
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7
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S.H. Park, H.J. Kim, D.B. Lee, J.S. Lee, Y.K Choi, O.M. Kwon, ¡°Heterogeneous crystallization of amorphous silicon expedited by external force fields: a molecular dynamics study,¡± Suprelattices and Microstructures, Vol.35, pp.205-215, 2004.
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6
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W.S. Chung, O.M. Kwon, D.S. Choi, S. Park, Y.K. Choi, J.S. Lee, ¡°Tunable AC thermal anemometry,¡± Suprelattices and Microstructures, Vol.35, pp.325-338, 2004.
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5
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O.M. Kwon, A. Majumdar, ¡°CROSS-SECTIONAL THERMAL IMAGING OF A METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR,¡± Microscale Thermophysical Engineering, Vol.7, pp.349-354, 2003.
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4
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O.M. Kwon, L. Shi, A. Majumdar, ¡°Scanning Thermal Wave Microscopy (STWM),¡± Journal of Heat Transfer-Transactions of the ASME, Vol.125, pp.156-163, 2003.
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3
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J. Lee, S. Park, O.M. Kwon, Y.K. Choi, J.S. Lee, ¡°Characterization of Thin Liquid Films Using Molecular Dynamics Simulation,¡± KSME International Journal, Vol.16, pp.1477-1484, 2002.
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2
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L. Shi, O.M. Kwon, A.C. Miner, A. Majumdar, ¡°Design and Batch Fabrication of Probes for Sub-100 nm Scanning Thermal Microscopy,¡± Journal of MicroElectroMechanical Systems, Vol.10, pp.370-378, 2001.
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1
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T. Perazzo, M. Mao, O.M. Kwon, A. Majumdar, J.B. Varesi, P. Norton, ¡°Infrared Vision Using Uncooled Micro-optomechanical Camera,¡± Applied Physics Letters, Vol.74, pp.3567-3569, 1999.
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